Ultrafast Optical and Magnetic Characterization
One of the most effective probes of quality and performance of semiconducting devices is optical spectroscopy. The Center has access to several laser systems that can deliver broad spectral excitation, and to many high-resolution detection systems including spectrometers and charge-coupled devices with cameras that cover the UV-VIS-NIR range. The measurements that these equipment can perform include:
- Photoluminescence spectroscopy over 350 – 1700 nm
- Time-resolved single photon counting lifetime characterization with 12 ps resolution
- Ultrafast laser for charge carrier dynamics including two-color time-resolved pump-probe spectroscopy
- High-speed camera for in-situ, dynamic observation.