Materials Synthesis and Characterization

A wide range of equipment for the synthesis of organic and inorganic materials and formation of hierarchically functional hybrids is available. The center has access to a variety of thin film deposition instruments such as Magnetron AC Sputtering system (VTC-1RF, MTI) and Atomic Layer Deposition (Savannah 100, Cambridge Nanotech), We have also established infrastructure for comprehensive materials characterization, including:

  • Polymer and composite characterization: QA 600 differential scanning calorimeter and thermal gravimetric analysis. Waters breeze 2 system gel permeation chromatography, mechanical property characterization;
  • Chemical analysis: Nicolet FTIR and UV-Vis spectroscopy;
  • Surface property study: Park system AFM and contact angle measurement instrument.
FTIR Spectrometer

FTIR Spectrometer

Zeiss XXX Electron Microscope

Zeiss XXX Electron Microscope

Oxford Atomic Layer Deposition

Oxford Atomic Layer Deposition